Different effects of electronic excitation on metals and semiconductors

Gai-Qin Yan, Xin-Lu Cheng, Hong Zhang, Zhi-Yang Zhu, and Da-Hua Ren
Phys. Rev. B 93, 214302 – Published 6 June 2016
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Abstract

We study the electronic excitation effect upon ultrafast and intense laser irradiation on the stability of target materials, using density functional perturbation theory. The target materials include metals (Li, Na, Mg, Al, K, W, Au), Bi as a semimetal, and Si as a semiconductor. We found that the electronic excitation had different effects on the two distinct materials. For metals, the electronic pressure induces an increase in the shear modulus and presents a negative effect on the phonon entropy, which increases the lattice vibration frequency and melting temperature, leading to a higher stability for the close-packed structure (Al, Au, Mg). Conversely, the electronic pressure induces a decreasing trend in all these quantities, leading to a lower degree of stability and even a structural destabilization in the case of bcc-structured metals (W, Na, K, and Li). For semimetals and semiconductors, the internal pressure induces a completely opposite behavior with respect to close-packed structure metals. This can lead to structural destabilization for semimetals and even collapse for semiconductors. Finally, a shift of the Raman and infrared active modes is revealed for semimetals and semiconductors.

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  • Received 18 November 2015
  • Revised 12 May 2016

DOI:https://doi.org/10.1103/PhysRevB.93.214302

©2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Gai-Qin Yan1, Xin-Lu Cheng1,2,*, Hong Zhang1,2,3, Zhi-Yang Zhu1, and Da-Hua Ren1

  • 1Institute of Atomic and Molecular Physics, Sichuan University, Chengdu 610065, China
  • 2Key Laboratory of High Energy Density Physics and Technology of Ministry of Education, Sichuan University, Chengdu 610065, China
  • 3College of Physical Science and Technology, Sichuan University, Chengdu 610065, China

  • *Corresponding author: chengxl@scu.edu.cn

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Issue

Vol. 93, Iss. 21 — 1 June 2016

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