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{'doi': '10.3788/col201816.011404', 'member_id': '2099', 'member': 'Shanghai Institute of Optics and Fine Mechanics', 'container-title': 'Chinese Optics Letters', 'primary-resource': 'https://www.researching.cn/articles/OJacfe91c72806a2be/html', 'tld': 'researching.cn', 'clearbit-logo': '/static/no_logo.svg', 'coaccess': [], 'multiple-resolution': [{'url': 'http://www.clp.ac.cn/EN/Article/OJacfe91c72806a2be', 'tld': 'clp.ac.cn', 'clearbit-logo': 'https://logo.clearbit.com/clp.ac.cn'}, {'url': 'http://col.opticsx.org/abstract.aspx?id=COL201816011404-4', 'tld': 'opticsx.org', 'clearbit-logo': '/static/no_logo.svg'}], 'type': 'JOURNAL ARTICLE', 'published_date': '2018', 'publication': 'Chinese Optics Letters', 'supplementary_ids': 'OJ180108000148x5A8D0', 'title': 'Stress damage process of silicon wafer under millisecond laser irradiation', 'name': None, 'id': None, 'location': None, 'display_doi': 'https://doi.org/10.3788/col201816.011404', 'grant_info': None, 'editors': None, 'authors': 'Zhichao Jia Zhichao Jia | Tingzhong Zhang Tingzhong Zhang | Huazhong Zhu Huazhong Zhu | Zewen Li Zewen Li | Zhonghua Shen Zhonghua Shen | Jian Lu Jian Lu | Xiaowu Ni Xiaowu Ni', 'chairs': None}
https://doi.org/10.3788/col201816.011404
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